JPS57102017A - Pattern detector - Google Patents

Pattern detector

Info

Publication number
JPS57102017A
JPS57102017A JP55177282A JP17728280A JPS57102017A JP S57102017 A JPS57102017 A JP S57102017A JP 55177282 A JP55177282 A JP 55177282A JP 17728280 A JP17728280 A JP 17728280A JP S57102017 A JPS57102017 A JP S57102017A
Authority
JP
Japan
Prior art keywords
slit
photomultiplier
output
shielding pattern
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55177282A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6236635B2 (en]
Inventor
Shinji Kuniyoshi
Akihiro Takanashi
Toshishige Kurosaki
Sumio Hosaka
Yoshio Kawamura
Tsuneo Terasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55177282A priority Critical patent/JPS57102017A/ja
Priority to US06/330,778 priority patent/US4441206A/en
Publication of JPS57102017A publication Critical patent/JPS57102017A/ja
Publication of JPS6236635B2 publication Critical patent/JPS6236635B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP55177282A 1980-12-17 1980-12-17 Pattern detector Granted JPS57102017A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP55177282A JPS57102017A (en) 1980-12-17 1980-12-17 Pattern detector
US06/330,778 US4441206A (en) 1980-12-17 1981-12-14 Pattern detecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55177282A JPS57102017A (en) 1980-12-17 1980-12-17 Pattern detector

Publications (2)

Publication Number Publication Date
JPS57102017A true JPS57102017A (en) 1982-06-24
JPS6236635B2 JPS6236635B2 (en]) 1987-08-07

Family

ID=16028305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55177282A Granted JPS57102017A (en) 1980-12-17 1980-12-17 Pattern detector

Country Status (2)

Country Link
US (1) US4441206A (en])
JP (1) JPS57102017A (en])

Families Citing this family (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5994419A (ja) * 1982-11-19 1984-05-31 Canon Inc 分割焼付け装置におけるアライメント方法
US4964069A (en) * 1987-05-12 1990-10-16 International Business Machines Corporation Self adjusting video interface
US4896206A (en) * 1987-12-14 1990-01-23 Electro Science Industries, Inc. Video detection system
US6067379A (en) * 1988-12-09 2000-05-23 Cognex Corporation Method and apparatus for locating patterns in an optical image
US5717785A (en) * 1992-01-30 1998-02-10 Cognex Corporation Method and apparatus for locating patterns in an optical image
US5086478A (en) * 1990-12-27 1992-02-04 International Business Machines Corporation Finding fiducials on printed circuit boards to sub pixel accuracy
US5371690A (en) * 1992-01-17 1994-12-06 Cognex Corporation Method and apparatus for inspection of surface mounted devices
US6002793A (en) * 1992-01-30 1999-12-14 Cognex Corporation Machine vision method and apparatus for finding an object orientation angle of a rectilinear object
JP3350822B2 (ja) * 1992-08-04 2002-11-25 アイシン精機株式会社 画像上のエッジ検出方法
US5805722A (en) * 1993-11-22 1998-09-08 Cognex Corporation Method and apparatus for locating, inspecting, and placing large leaded devices
US5602937A (en) * 1994-06-01 1997-02-11 Cognex Corporation Methods and apparatus for machine vision high accuracy searching
US5767980A (en) * 1995-06-20 1998-06-16 Goss Graphic Systems, Inc. Video based color sensing device for a printing press control system
US5801966A (en) * 1995-07-24 1998-09-01 Cognex Corporation Machine vision methods and articles of manufacture for determination of convex hull and convex hull angle
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
US5754679A (en) * 1995-10-31 1998-05-19 Cognex Corp. Image rotating method for locating bond pads in an image
US5757956A (en) * 1995-10-31 1998-05-26 Cognex Corp. Template rotating method for locating bond pads in an image
US5845007A (en) * 1996-01-02 1998-12-01 Cognex Corporation Machine vision method and apparatus for edge-based image histogram analysis
US5872870A (en) * 1996-02-16 1999-02-16 Cognex Corporation Machine vision methods for identifying extrema of objects in rotated reference frames
JP2842362B2 (ja) * 1996-02-29 1999-01-06 日本電気株式会社 重ね合わせ測定方法
US5909504A (en) * 1996-03-15 1999-06-01 Cognex Corporation Method of testing a machine vision inspection system
US5949901A (en) * 1996-03-21 1999-09-07 Nichani; Sanjay Semiconductor device image inspection utilizing image subtraction and threshold imaging
US6298149B1 (en) 1996-03-21 2001-10-02 Cognex Corporation Semiconductor device image inspection with contrast enhancement
US6259827B1 (en) 1996-03-21 2001-07-10 Cognex Corporation Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
US5978502A (en) * 1996-04-01 1999-11-02 Cognex Corporation Machine vision methods for determining characteristics of three-dimensional objects
US6137893A (en) * 1996-10-07 2000-10-24 Cognex Corporation Machine vision calibration targets and methods of determining their location and orientation in an image
US5960125A (en) * 1996-11-21 1999-09-28 Cognex Corporation Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
US5953130A (en) * 1997-01-06 1999-09-14 Cognex Corporation Machine vision methods and apparatus for machine vision illumination of an object
US6075881A (en) * 1997-03-18 2000-06-13 Cognex Corporation Machine vision methods for identifying collinear sets of points from an image
US5974169A (en) * 1997-03-20 1999-10-26 Cognex Corporation Machine vision methods for determining characteristics of an object using boundary points and bounding regions
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US5978080A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
US6025854A (en) * 1997-12-31 2000-02-15 Cognex Corporation Method and apparatus for high speed image acquisition
US6236769B1 (en) 1998-01-28 2001-05-22 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
US6282328B1 (en) 1998-01-28 2001-08-28 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
US6215915B1 (en) 1998-02-20 2001-04-10 Cognex Corporation Image processing methods and apparatus for separable, general affine transformation of an image
US6381375B1 (en) 1998-02-20 2002-04-30 Cognex Corporation Methods and apparatus for generating a projection of an image
US6154567A (en) * 1998-07-01 2000-11-28 Cognex Corporation Pattern similarity metric for image search, registration, and comparison
US7016539B1 (en) 1998-07-13 2006-03-21 Cognex Corporation Method for fast, robust, multi-dimensional pattern recognition
US6381366B1 (en) 1998-12-18 2002-04-30 Cognex Corporation Machine vision methods and system for boundary point-based comparison of patterns and images
US6687402B1 (en) 1998-12-18 2004-02-03 Cognex Corporation Machine vision methods and systems for boundary feature comparison of patterns and images
US6684402B1 (en) 1999-12-01 2004-01-27 Cognex Technology And Investment Corporation Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
US6748104B1 (en) 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns
US7006669B1 (en) 2000-12-31 2006-02-28 Cognex Corporation Machine vision method and apparatus for thresholding images of non-uniform materials
US7190834B2 (en) * 2003-07-22 2007-03-13 Cognex Technology And Investment Corporation Methods for finding and characterizing a deformed pattern in an image
US8081820B2 (en) 2003-07-22 2011-12-20 Cognex Technology And Investment Corporation Method for partitioning a pattern into optimized sub-patterns
US7613316B2 (en) * 2003-07-22 2009-11-03 L-3 Communications Security and Detection Systems Inc. Methods and apparatus for detecting objects in baggage
US8437502B1 (en) 2004-09-25 2013-05-07 Cognex Technology And Investment Corporation General pose refinement and tracking tool
US20060147707A1 (en) * 2004-12-30 2006-07-06 Jian Meng Compacted, chopped fiber glass strands
US7639861B2 (en) 2005-09-14 2009-12-29 Cognex Technology And Investment Corporation Method and apparatus for backlighting a wafer during alignment
US8111904B2 (en) * 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8162584B2 (en) * 2006-08-23 2012-04-24 Cognex Corporation Method and apparatus for semiconductor wafer alignment
US8103085B1 (en) 2007-09-25 2012-01-24 Cognex Corporation System and method for detecting flaws in objects using machine vision
US9679224B2 (en) 2013-06-28 2017-06-13 Cognex Corporation Semi-supervised method for training multiple pattern recognition and registration tool models

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5369063A (en) * 1976-12-01 1978-06-20 Hitachi Ltd Detector of position alignment patterns
JPS55162756A (en) * 1979-06-04 1980-12-18 Mitsubishi Chem Ind Ltd Preparation of cyclohexenedicarboxylic acid diamide
US4362389A (en) * 1980-02-19 1982-12-07 Hitachi, Ltd. Method and apparatus for projection type mask alignment

Also Published As

Publication number Publication date
US4441206A (en) 1984-04-03
JPS6236635B2 (en]) 1987-08-07

Similar Documents

Publication Publication Date Title
JPS57102017A (en) Pattern detector
JPS5766345A (en) Inspection device for defect
JPS54130825A (en) Image scanner
JPS5598842A (en) Position detection system
GB2021260A (en) Optical gauging of cross- sectional dimensions
JPS5753838A (en) Beam position detecting system for recorder and reproducer of optical disk
JPS5445127A (en) Focus detector by photo sensor alley
JPS5676004A (en) Measuring device of flatness
JPS5459169A (en) Size measuring apparatus
JPS564004A (en) System for detecting minute defects of body
GB2014304A (en) Avoiding Drift in Flame Photometers
JPS562562A (en) Deciding method for particle coagulation pattern
JPS57104807A (en) Edge detector for object
JPS56116006A (en) Setting method for optical axis of light image
JPS5472076A (en) Method and apparatus for pattern inspection
JPS54138427A (en) Focus detecting method
JPS5412256A (en) Detector for electron beam
JPS5629116A (en) Measurement unit for moving distance
JPS57104840A (en) Fault detector
JPS5569076A (en) Measurement system for charge beam shape
JPS53100845A (en) Automatic focusing system
GB2121952A (en) Metrology of irradiated fuel rods
JPS54110563A (en) Optical read-out system
JPS5422743A (en) Laser spot scan patten detector
JPS5761904A (en) Pattern measuring device